Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
Liverpool John Moores University
Article title
NBTI Lifetime Prediction and Kinetics at Operation Bias Based on Ultrafast Pulse Measurement
Type
D - Journal article
Title of journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Article number
-
Volume number
57
Issue number
1
First page of article
228
ISSN of journal
0018-9383
Year of publication
2010
URL
-
Number of additional authors
4
Additional information
* The first paper ever to propose a new kinetic model for the degradation that can not only fit the existing test data, but also predict the degradation in the time domain where there are no test data.
* Significant as it proposed a new single-test technique for reliable prediction of device lifetime, with better accuracy and the simplified test procedure. It pointed out the substantial errors in the lifetime prediction technique used by the industry and analysed their causes.
* The paper led to an invited paper at the “10th IEEE International Conference on Solid-State and Integrated Circuit Technology”.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
