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13 - Electrical and Electronic Engineering, Metallurgy and Materials

University of Surrey

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Article title

Single Event Effects in Power MOSFETs Due to Atmospheric and Thermal Neutrons

Type

D - Journal article

DOI

10.1109/TNS.2011.2168540

Title of journal

IEEE Transactions on Nuclear Science

Article number

Volume number

Issue number

First page of article

2687

ISSN of journal

0018-9499

Year of publication

2011

URL

Number of additional authors

Additional information

This paper provides the first report of power MOSFETS suffering single event destructive burnout (SEB) caused by extremely low energy thermal neutron environments. Since the flux of thermalized neutrons in many practical cases can exceed that of the primary fast neutrons such effects are potentially significant for future electronic reliability in aerospace and nuclear applications. In addition the paper makes the first observation of another damage effect, single event gate rupture (SEGR), occurring under fast neutron irradiation. The impact is to enable better quantification of reliability of power devices in aviation environments as we move to the all-electric aircraft.

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract