Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Surrey
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Article title
Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS
Type
D - Journal article
Title of journal
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Article number
-
Volume number
268
Issue number
11-12
First page of article
1714
ISSN of journal
0168583X
Year of publication
2010
URL
-
Number of additional authors
-
Additional information
First time demonstration of MeV SIMS combined with PIXE and RBS simultaneously with the same beam and the worlds first scanning MeV SIMS imaging system. This is crucial in ruling out matrix fluctuations in secondary ion yields. The paper formed the basis for a Grant from EPSRC (£1.6M) to develop an atmospheric version of this instrument. An IAEA invitation to chair a consultants meeting on “Improving the Analytical Capabilities of Heavy Ion IBA” in Vienna, followed by a technical meeting on the “Development and Utilization of MeV-SIMS” which Webb co-organised with the groups in Zagreb and Kyoto resulted from this work.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
