Output details

Position determination of scatter signatures – A novel sensor geometry

Novel diffraction sensor geometry able to provide the diffraction pattern of a suspect material without prior knowledge of the samples location is demonstrated. This technique can also resolve diffraction patterns originating from multiple unknown materials overlapped along the primary X-ray beam path. Specifically addresses materials characterisation in an airport screening environment or equally the rapid screening for illicit drugs trafficked through the postal system. This programme of work is funded by via linked EPSRC (EP/F017596/1) & (EP/F0178041) and is in collaboration with the UK Home Office Scientific Development Branch (HOSDB) and the US Department of Homeland Security (DHS).