Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Birmingham : A - Electronic, Electrical and computer engineering
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Article title
Identification of vacancy defects in a thin film perovskite oxide
Type
D - Journal article
Title of journal
Physical Review B
Article number
064102
Volume number
81
Issue number
6
First page of article
n/a
ISSN of journal
1098-0121
Year of publication
2010
URL
-
Number of additional authors
6
Additional information
This paper, in a premier physics journal, reports a significantly higher depth resolution in the detection of atomic vacancies in thin films. It enables thin oxide films to be optimised to much higher quality for electronics applications, for example in discrete microwave components or on-chip components. The work is in collaboration with Dundee University where Jackson’s leading track record in thin film growth and nuclear probes of solid state systems were central to realising an effective sample set and modelling and analysis of the data. This method is now used by academic users in the USA and Germany.
Interdisciplinary
-
Cross-referral requested
-
Research group
A - Microwave Devices and Systems
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
