Output details
11 - Computer Science and Informatics
University of Oxford
Assume-guarantee validation for STE properties within an SVA environment
<01>
This research brings together a distinctive mix of theory, methodology, and experimentation and a novel implementation idea, addressing a significant industrial problem: bridging the gap between formal verification and simulation for validation of microchip designs. This work has detected bugs in real designs and is widely used by execution cluster validation teams at Intel’s Israel Design Centre to improve the quality of their formal verification environments. These results are also successfully used at Intel for test-pattern generation to search for stuck-at faults. The resulting verification tool has earned an internal Intel award. (Corroboration: senior technical staff contact details on file)