Output details
15 - General Engineering
University of Liverpool
Permittivity enhancement of hafnium dioxide high-K films by cerium doping
Realisation of permittivity enhancement by doping of hafnia using an atomic layer deposition manufacturing process. The work led to a further EPSRC project EP/I012907/1 on high-K dielectrics for germanium-based electronics (evidence file Chalker1-1.pdf). The work was also supported financially by SAFC Hitech. Sigma Aldrich patent applications WO2009143456(A1) (evidence file Chalker1-2.pdf), and WO2009143452(A1) (evidence file Chalker1-3.pdf) arose from the original research. The research was presented in an invited talk at 5th International Workshop on High-Resolution Depth Profiling, Kyoto, Japan, Nov 2009 (evidence file Chalker1-4.pdf).