Output details
12 - Aeronautical, Mechanical, Chemical and Manufacturing Engineering
University of Manchester : A - Chemical Engineering
Article title
Depth Profiling Brain Tissue Sections with a 40 keV C60+ Primary Ion Beam
Type
D - Journal article
Title of journal
Analytical Chemistry
Article number
-
Volume number
80
Issue number
6
First page of article
2125
ISSN of journal
1520-6882
Year of publication
2008
URL
-
Number of additional authors
2
Additional information
The introduction of C60+ primary beams by this laboratory in early 2002 enabled ToF-SIMS to provide a molecular depth profiling and 3D imaging capability for the first time. The ability to probe the chemistry of tissue in 2 and 3 dimensions is illustrated by a study of protein and lipid distributions in rat brain. The importance of sample preparation temperature on the accuracy of the distributions is illustrated. The approach was embraced by many groups resulting in the wide up-take of the technology (~150 sales) and well over 100 reports using the C60 beam for analysis and depth profiling.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
