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13 - Electrical and Electronic Engineering, Metallurgy and Materials

University College London

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Article title

Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy

Type

D - Journal article

DOI

10.1063/1.3126053

Title of journal

Applied Physics Letters

Article number

171104

Volume number

Issue number

First page of article

ISSN of journal

0003-6951

Year of publication

2009

URL

Number of additional authors

Additional information

Review of near-field terahertz microscopy (doi:101007/s10762-011-9809-02) described this work as the first time-resolved near-field mapping of modes in THz waveguides. It solves the problem of mode-interference artifacts and provides mode structure information and mode composition. The research progressed into a collaboration with industry (SWISSto12, Switzerland), which is supporting further research, including PhD studentship; became a main research area of a funded project (Royal Society, ~£550k); led to an invited presentation at a major European conference on THz Research (EOS THz Science and Technology, 2012), industrial THz technology workshop, and invited paper (inaugural issue, IEEE Transactions on THz Science and Technology)

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract