Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
Liverpool John Moores University
New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
* The first paper ever to propose and demonstrate a new analysis method for characterising time-dependent device-to-device variation accounting for the within-device fluctuation.
* Significant as it overcomes the shortcomings of existing methods by successfully capturing the maximum degradation for the time-dependent device variations, a major challenge for designing circuits with nanometer-sized devices.
* The knowledge gained from this work led to the award of an EPSRC research grant “Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization” (Grant No: EP/L010607/1, £517k), together with Glasgow University in collaboration with Arm Ltd and Cambridge Silicon Radio Ltd.