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Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

Imperial College London : B - Metallurgy and Materials

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Article title

Understanding x-ray diffraction of nonpolar gallium nitride films

Type

D - Journal article

DOI

10.1063/1.3129307

Title of journal

Journal of Applied Physics

Article number

ARTN 113501

Volume number

105

Issue number

First page of article

ISSN of journal

0021-8979

Year of publication

2009

URL

Number of additional authors

Additional information

XRD is used widely for defect density monitoring in devices, but it can be very complex to understand when different defect types are present. This paper showed how to interpret XRD data from new 'nonpolar' thin film III-nitride device materials of substantial current interest and led to the EPSRC grant EP/J003603/1. MA Moram gave 4 invited talks at international conferences on this work and on subsequent work arising from it, including at XTOP, the most important XRD conference worldwide (XTOP 2012, BIT 2012, IWPSD-15 2009, POLARCON 2009).

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract