You are in : Home » Results & submissions » Select UOA » 13 - Electrical and Electronic Engineering, Metallurgy and Materials » View submission: Loughborough University » Outputs » Detail

Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

Loughborough University

Return to search Previous output Next output

Output 0 of 0 in the submission

Article title

Bidirectional Electromigration Failure

Type

D - Journal article

DOI

10.1016/j.microrel.2013.07.017

Title of journal

Microelectronics Reliability

Article number

Volume number

Issue number

9-11

First page of article

1261

ISSN of journal

0026-2714

Year of publication

2013

URL

Number of additional authors

Additional information

This work represents the first output from an international collaboration between the Electronics Systems Design Group at Loughborough. Globalfoundries in Singapore and Nanyang Technological University (NTU). It follows from a research visit of one of the authors (VMD) to NTU.

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract