Output details
15 - General Engineering
University of Glasgow
Batch fabricated dual cantilever resistive probe for scanning thermal microscopy
The thermal properties of nano-materials differ from the bulk and dominate the performance of modern devices. Scanning Thermal Microscopy (SThM) allows accurate thermometry at the nano-scale but the accurate measurement of thermal conductivity requires the provision of a known heat source close to the thermometer. Using two or more SThM probes, monolithically co-fabricated at separations down to 300nm, the temperature rise resulting from the local injection of heat, and hence the thermal conductivity, may be determined accurately. The work led to an invited plenary talk (TFNT 2012, Linz, Austria) and significant funding (EU FP7 MORGaN/QUANTIHEAT €294k/€823k, EPSRC EP/J010774/1, £563k).
