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Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

University of Sheffield : A - Electronic and Electrical Engineering

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Output 20 of 122 in the submission
Article title

An annealing algorithm to correct positioning errors in ptychography

Type
D - Journal article
Title of journal
Ultramicroscopy
Article number
-
Volume number
120
Issue number
-
First page of article
64
ISSN of journal
03043991
Year of publication
2012
Number of additional authors
4
Additional information

My method (ptychography) that has already revolutionised synchrotron-based X-ray microscopy (by disposing of poor-quality Fresnel zone plate lenses) has previously been limited by the mechanical and electronic stability at the amplitude of 0.05nm beam position control. Developed as part of EPSRC Basic Tech Grant EP/E034055/1, the work overcomes this key blockage. A patent on the technique was sold to Phase Focus Ltd (www.phasefocus.com), which is incorporating it in an electron microscopy add-product in conjunction with Gatan Inc. (www.gatan.com) that enhances image resolution by several factors and produces very sensitive phase images for imaging (amongst many things) nano-scale magnetic fields.

Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-