Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Surrey
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Article title
Kinetics and Morphological Instabilities of Stressed Solid-Solid Phase Transformations
Type
D - Journal article
Title of journal
Physical Review Letters
Article number
165501
Volume number
100
Issue number
16
First page of article
-
ISSN of journal
1079-7114
Year of publication
2008
URL
-
Number of additional authors
-
Additional information
An atomistic model of the growth kinetics of stressed solid-solid phase transformations is presented. This work conducted with international co-authors highlights the importance of accurate computer models for device applications. Solid phase epitaxial growth of (001) Si was used for comparison of new and prior models with experiments. As device types move away from conventional CMOS to FINFET’s with next generation integrated electronics, such atomistic modelling approaches will be essential to design and produce nano-devices.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
