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Investigation of the internal electric field distribution underin situx-ray irradiation and under low temperature conditions by the means of the Pockels effect

Cadmium Zinc Telluride (CZT) gamma-ray spectrometers are – in principle – expected to show better energy resolution at reduced temperatures T due to the reduction of leakage currents. However, many groups have demonstrated experimentally that the detector performance degrades even with moderate cooling as well as under high intensity irradiation, where changes in charge transport parameters should not be significant. This work shows and interprets the strong modification of electric field distributions under X-ray irradiation and at lower T in CZT detectors, which is crucial in order to understand the (in)stability of response in detectors based on this material.