Output details
15 - General Engineering
University of Huddersfield
Article title
Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurements
Type
D - Journal article
Title of journal
Measurement Science and Technology
Article number
-
Volume number
22
Issue number
9
First page of article
094017
ISSN of journal
0957-0233
Year of publication
2011
Number of additional authors
4
Additional information
This output reports the methodology and instrumentation for the use of atomic force microscope (AFM) cantilevers as nan-oscale encoders for displacement measurements. 5 related peer reviewed papers were published in Meas. Sci. Technol., Procedia Engineering, proceedings of SPIE. The fact that AFM cantilevers can be used as encoders resulted from this work performed by myself at PTB, Germany and was exploited in the form of a resulting patent Winkelteilung Bundesrepublik Deutschland Deutsches Paten-und Markenamt DE 10 2006 021 289 B4". The ideas behind this patent were realized by myself and Dr Ludger Koenders (PTB).
Interdisciplinary
Yes
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
