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Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches

There have been a number of approaches to determining residual stress using nanoindentation. In all, the work has been validated by finite element modelling. This is the first paper to use strain measurements from synchrotron X-ray diffraction to validate the residual strain and thus residual stress measurements from nanoindentation. The problem of stress around scratch roots is complex because in addition to residual stress contributing to changes in nanoindentation data, there is work hardening which changes mechanical properties. The combination of nanoindentation and synchrotron X-rays allows residual stresses to be determined on a micro-scale not accessible by other techniques.