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Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

University of Plymouth

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Article title

On the influence of the top and bottom electrodes - A comparative study between Pt and LNO electrodes for PZT thin films

Type
D - Journal article
Title of journal
JOURNAL OF CRYSTAL GROWTH
Article number
-
Volume number
310
Issue number
14
First page of article
3299
ISSN of journal
0022-0248
Year of publication
2008
Number of additional authors
6
Additional information

It has long been known that the quality of ferroelectric film depends on the substrate and lower electrode that the film is grown on. LNO, as a top and bottom electrode, significantly extends the performance of PZT thin films. This paper presents our novel approach to designing MEMS devices, improving their dynamic capability, whilst also minimising the effects of fatigue in MRAM applications. This work has been applied by Li et al to develop the next generation of highly functional lead-free films for MEMS devices [Li,Tao; Wang,Genshui; Li,Kui; et al. J.Am.Cer Soc.Volume:96(3)].

Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-