Output details

Ambient analysis of trace compounds in gaseous media by SIFT-MS

This paper places selected ion flow tube mass spectrometry, SIFT-MS, developed by the co-authors at Keele, into the context of the methods for ambient gas analysis, the essential feature of which is that real time analysis can be accomplished, crucially avoiding sample collection or modification. The ion chemistry underpinning SIFT-MS is now understood due to the extensive studies at Keele of the reactions of different classes of organic and inorganic molecules with H3O+, NO+ and O2+ ions. The kinetic data obtained facilitate absolute SIFT-MS analyses and are used for the interpretation of data obtained by the other ambient analytical methods.