Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Oxford
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Article title
Direct imaging of rotational stacking faults in few layer graphene.
Type
D - Journal article
Title of journal
Nano Lett
Article number
-
Volume number
9
Issue number
1
First page of article
102
ISSN of journal
1530-6984
Year of publication
2009
Number of additional authors
4
Additional information
Atomic resolution imaging of sp2 carbon materials is enabled by the availability of aberration-corrected transmission electron microscopes and reducing the accelerating voltage below the threshold for knock-on damage. The technique has enabled a vast range of atomic-level defects and impurities in single layers of graphene to be created, manipulated, and imaged, and opens the way to study how transport properties depend on them. This work has led to 15 subsequent papers with IFW Dresden, and new collaborations with Cambridge and National University of Singapore.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-