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13 - Electrical and Electronic Engineering, Metallurgy and Materials

Liverpool John Moores University

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Article title

New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation

Type

D - Journal article

DOI

10.1109/TED.2013.2270893

Title of journal

IEEE Transactions on Electron Devices

Article number

Volume number

Issue number

First page of article

2505

ISSN of journal

0018-9383

Year of publication

2013

URL

Number of additional authors

Additional information

* The first paper ever to propose and demonstrate a new analysis method for characterising time-dependent device-to-device variation accounting for the within-device fluctuation.

* Significant as it overcomes the shortcomings of existing methods by successfully capturing the maximum degradation for the time-dependent device variations, a major challenge for designing circuits with nanometer-sized devices.

* The knowledge gained from this work led to the award of an EPSRC research grant “Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization” (Grant No: EP/L010607/1, £517k), together with Glasgow University in collaboration with Arm Ltd and Cambridge Silicon Radio Ltd.

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract