Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
Loughborough University
Article title
Bidirectional Electromigration Failure
Type
D - Journal article
Title of journal
Microelectronics Reliability
Article number
-
Volume number
53
Issue number
9-11
First page of article
1261
ISSN of journal
0026-2714
Year of publication
2013
URL
-
Number of additional authors
3
Additional information
This work represents the first output from an international collaboration between the Electronics Systems Design Group at Loughborough. Globalfoundries in Singapore and Nanyang Technological University (NTU). It follows from a research visit of one of the authors (VMD) to NTU.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-