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Achieving subdiffraction imaging through bound surface states in negative refraction photonic crystals in the near-infrared range

First proof of imaging beyond the diffraction limit by using negative index photonic crystal lenses made of silicon, which implies strong potential for chip-scale integration. We showed that the sub-diffraction imaging is due to a new physical mechanism, namely optical transmission through surface modes. The imaging device investigated in this work was implemented using only dielectric materials, so that we have achieved a figure of merit of about 125 times larger than the state-of-the-art. This work has applications to chip-scale imaging systems, ultra-compact optical couplers and single-molecule detection devices. Research is the result of an international collaboration with Columbia University.