Output details

Acoustic time-frequency domain imaging.

This EPSRC supported work (EP/G004358/1) helps address the International Technology Roadmap for Semiconductors major challenge in the area of acoustics, i.e. to resolve small defects in the axial direction. A novel acoustic time-frequency domain imaging technique was proposed. Experiments performed on real 3D data collected from microelectronic packages demonstrate applicability to many electronics industries. Breakthrough results demonstrated that the proposed technique reveals more image detail and enhances contrast compared to conventional acoustic imaging. This enables improved failure analysis for current and future electronics systems. The outcomes of this work were adopted by Delphi Electronics and Safety.