Output details

Analysis of triple phase contact in Ni-YSZ microstructures using non-destructive X-ray tomography with synchrotron radiation

The new field of X-ray nano computed tomography provides a step change in achievable resolution – facilitating non-destructive CT with sub-50nm resolution. The 32-ID beamline at the Advance Photon Source (Argonne, USA) was amongst the first beamlines in the world to install this capacity. As an early user of this new facility, this paper was amongst the first published by the user community using data from the new beamline and demonstrates proof-of-concept work to apply x-ray absorption spectroscopy imaging to SOFC microstructures – a technique that has been subsequently replicated by a number of groups in USA, China and France.