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Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

University of Oxford

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Output 26 of 136 in the submission

Article title

Direct imaging of rotational stacking faults in few layer graphene.

Type

D - Journal article

DOI

10.1021/nl8025949

Title of journal

Nano Lett

Article number

Volume number

Issue number

First page of article

102

ISSN of journal

1530-6984

Year of publication

2009

URL

http://www.ncbi.nlm.nih.gov/pubmed/19072722

Number of additional authors

Additional information

Atomic resolution imaging of sp2 carbon materials is enabled by the availability of aberration-corrected transmission electron microscopes and reducing the accelerating voltage below the threshold for knock-on damage. The technique has enabled a vast range of atomic-level defects and impurities in single layers of graphene to be created, manipulated, and imaged, and opens the way to study how transport properties depend on them. This work has led to 15 subsequent papers with IFW Dresden, and new collaborations with Cambridge and National University of Singapore.

Interdisciplinary

Cross-referral requested

Research group

None

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract