Output details
15 - General Engineering
University of Huddersfield
Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurements
This output reports the methodology and instrumentation for the use of atomic force microscope (AFM) cantilevers as nan-oscale encoders for displacement measurements. 5 related peer reviewed papers were published in Meas. Sci. Technol., Procedia Engineering, proceedings of SPIE. The fact that AFM cantilevers can be used as encoders resulted from this work performed by myself at PTB, Germany and was exploited in the form of a resulting patent Winkelteilung Bundesrepublik Deutschland Deutsches Paten-und Markenamt DE 10 2006 021 289 B4". The ideas behind this patent were realized by myself and Dr Ludger Koenders (PTB).