Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Oxford
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Article title
Achieving sub-nanometre particle mapping with energy-filtered TEM
Type
D - Journal article
Title of journal
Ultramicroscopy
Article number
-
Volume number
109
Issue number
10
First page of article
1217
ISSN of journal
0304-3991
Year of publication
2009
URL
-
Number of additional authors
2
Additional information
This paper describes, for the first time, the application of multivariate statistical analysis to EFTEM datasets. By combining a state-of-the-art electron microscope with post-acquisition data processing, a record spatial resolution was achieved (still the world-leading value). More than 10 follow-on papers have applied the technique to a variety of materials with UK and international collaborators. These results were part of the case for support for the £6m EPSRC fusion/fission grant awarded to Oxford (EP/I003274/1) and the technique forms a major theme in the nuclear projects in the successful South of England Analytical TEM application in 2013 (EP/K040375/1).
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
