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Output details

9 - Physics

Output 12 of 293 in the submission

Article title

A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy

Type

D - Journal article

DOI

Title of journal

Ultramicroscopy

Article number

Volume number

110

Issue number

First page of article

105

ISSN of journal

0304-3991

Year of publication

2010

URL

Number of additional authors

Additional information

Interdisciplinary

Cross-referral requested

Research group

B - Condensed Matter Physics

Citation count

Proposed double-weighted

Double-weighted statement

Reserve for a double-weighted output

Non-English

English abstract