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Output details

15 - General Engineering

University of Huddersfield

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Output 34 of 121 in the submission
Article title

Comparison study of algorithms and accuracy in the wavelength scanning interferometry

Type
D - Journal article
Title of journal
Applied Optics
Article number
-
Volume number
51
Issue number
36
First page of article
8854
ISSN of journal
0003-6935
Year of publication
2012
Number of additional authors
2
Additional information

This paper critically discusses the accuracy of algorithms and their effects on the surface measurement using wavelength scanning interferometry (WSI). The research in this paper is used as a baseline for a prototype WSI which currently employed in a European program (NanoMend NMP4-LA-2011-280518(PI L Blunt) and being exploited under patent IBSPE (Netherlands) for on-line detection of nano scale defects. One of these algorithms has been led to further developments in surface metrology as reported in the publication: Gao, Muhamedsalih, and Jiang, Xiang: 'Surface and thickness measurement of a transparent film using ',Optics Express, Vol.20, Issue 19, pp. 21450-21456 (2012)

Interdisciplinary
Yes
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-