Output details
12 - Aeronautical, Mechanical, Chemical and Manufacturing Engineering
Cranfield University
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Article title
An approach to high-throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries
Type
D - Journal article
Title of journal
Journal of Applied Crystallography
Article number
-
Volume number
42
Issue number
-
First page of article
174
ISSN of journal
0021-8898
Year of publication
2009
URL
-
Number of additional authors
4
Additional information
This research was funded as part of the EPSRC PV21 consortium (EP/F029624). It removes an analysis bottleneck in combinatorial screening for materials investigation (gregoire@caltech.edu). The new technique has been applied to thin film catalysts for fuel cells and materials for solar cells in a further collaborative study with Cornell University (John M. Gregoire now at Caltech, gregoire@caltech.edu), the University of Bath and the Diamond Light Source (Roncallo S. et al, Analytical Chemistry, 82 (11) (2010) 4564-4569).
Interdisciplinary
-
Cross-referral requested
-
Research group
E - Sensors and Measurement Science
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
