Output details
12 - Aeronautical, Mechanical, Chemical and Manufacturing Engineering
Cranfield University
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Article title
Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry
Type
D - Journal article
Title of journal
Smart Materials and Structures
Article number
-
Volume number
19
Issue number
6
First page of article
065011
ISSN of journal
0964-1726
Year of publication
2010
URL
-
Number of additional authors
1
Additional information
This work developed a new measurement technique with increased throughput via reduced setup time and simplicity of measurement. The technique outlined in the paper has been used by Prof. M Cain (markys.cain@npl.co.uk) and Dr M Stewart (mark.stewart@npl.co.uk), of the functional materials group, NPL, Teddington, to develop this measurement technique as a standard for measuring the piezoelectric coefficient of new thin film materials.
Interdisciplinary
-
Cross-referral requested
-
Research group
D - Manufacturing & Materials
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
