Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Salford
Article title
Focused ion beam patterned Fe thin films: A study by selective area Stokes polarimetry and soft x-ray microscopy
Type
D - Journal article
Title of journal
Journal of Applied Physics
Article number
-
Volume number
109
Issue number
6
First page of article
063917
ISSN of journal
00218979
Year of publication
2011
URL
-
Number of additional authors
6
Additional information
This work utilises the basic principle of a novel polarimetric imaging technique and, in part, has led to T.Shen giving invited talks at Beijing University, National Astronomical Observatories CAS, Institute of Physics CAS and an International Conference on Nano Materials and Nano Devices in SuZhou, China, September 2012. It also forms part of a basis for attracting a private venture capital investment and the formation of a spin-out company, Optimum Imaging Ltd, to further the exploration of a novel imaging technique.
Interdisciplinary
-
Cross-referral requested
-
Research group
B - Materials synthesis and characterisation
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
