Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Sheffield : A - Electronic and Electrical Engineering
An improved ptychographical phase retrieval algorithm for diffractive imaging
Presents a highly-efficient algorithm to solve for the illumination field at the same time as an object function upon which it is incident, facilitating very high resolution, high phase-sensitive lensless microscopy. It is now being used for high-resolution X-ray imaging at many national synchrotron facilities (France, Germany (DESY – contact Prof H Chapman), Japan, Switzerland, USA (Berkeley and Argonne), Italy), each beamline of value £5-10m. This patented method (No: EP20110185312) was sold to Phase Focus Ltd, which now uses it in all its products, including its contact lens profilometer used by all four of the world’s biggest contact lens manufacturers.