Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Southampton
Improved state integrity of flip-flops for voltage scaled retention under PVT variation
Significance of output:
Literature reports on simulations have claimed that data corruption in microprocessors can occur as a result of the fabrication process, voltage variations or temperature variations. This paper is the first to show that state integrity of microprocessor registers are indeed sensitive to such variation, based on data measured from 82 fabricated silicon chips. The significance of this work is the experimental evidence demonstrating that low-voltage embedded processors are vulnerable to failures. This research was carried out with ARM, Cambridge over a four-year period (david.flynn@arm.com). This led to the award of EPSRC Programme Grant EP/K034448/1 (£5.6M).
