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Output details

13 - Electrical and Electronic Engineering, Metallurgy and Materials

University of Southampton

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Article title

Impact of channel constrictions on the formation of multiple tunnel junctions in heavily-doped silicon single electron transistors

Type
D - Journal article
Title of journal
Applied Physics Letters
Article number
-
Volume number
93
Issue number
11
First page of article
112107
ISSN of journal
0003-6951
Year of publication
2008
Number of additional authors
2
Additional information

Significance of output:

The first experimental study of multiple tunnel junctions (MTJs) naturally formed by random dopant atoms in the geometrically-constricted Si channel of single-electron transistors (SETs). The mechanism of undesirable MTJ formation, which causes uncontrolled variability in the SET characteristics, was revealed for the first time by comparing various constriction patterns systematically. A clear Coulomb oscillation with a single periodicity was demonstrated successfully by fabricating extremely sharp constrictions shorter than the characteristic length of dopant-induced charging islands. This finding was essential to come up with a novel integrated Si spin qubit architecture for the £1M EPSRC project EP/H016872/1 (2010 – 2013).

Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-