Output details
9 - Physics
University of Durham
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Output 0 of 0 in the submission
Article title
A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy
Type
D - Journal article
Title of journal
Ultramicroscopy
Article number
-
Volume number
110
Issue number
2
First page of article
105
ISSN of journal
0304-3991
Year of publication
2010
Number of additional authors
2
Additional information
-
Interdisciplinary
-
Cross-referral requested
-
Research group
B - Condensed Matter Physics
Citation count
4
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-