Output details
15 - General Engineering
University of Kent
Article title
Depth-Resolved Wavefront Aberrations using a Coherence-Gated Shack-Hartmann Wavefront Sensor
Type
D - Journal article
Title of journal
Optics Express
Article number
-
Volume number
18
Issue number
4
First page of article
3458
ISSN of journal
1094-4087
Year of publication
2010
URL
-
Number of additional authors
1
Additional information
This paper reports for the first time a hardware solution for equipping a Shack Hartmann (SH)- wavefront sensor (WFS) with principles of time or spectral domain interferometry to deliver depth resolved WFS data. This technology was protected by a patent (US20110134436, recently granted) and research on this subject became part of the ERC Advanced Grant (249889) awarded to Podoleanu. In comparison with existing software solutions of coherence gating applied to an WFS, which are slow, the solutions described in this paper have made it possible to achieve real time measurement of aberration.
Interdisciplinary
Yes
Cross-referral requested
-
Research group
2 - Instrumentation, control and embedded systems
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
