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Circularly polarized spherical illumination reflectometry

<26>This paper introduces a novel approach for measuring the surface reflectance property of objects for computer graphics and vision applications by measuring the Stokes parameters of reflected circularly polarized incident light. While prior techniques measured BRDFs by controlling the intensity and/or direction of incident illumination, this paper proposed a fundamentally new way of estimating BRDFs under completely constant uniform illumination by instead sensing the polarization properties of reflected light. The approach enables practical measurement of spatially varying material index of refraction and specular reflection parameters. The paper has been published at the top venue for computer graphics - ACM TOG.