Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Oxford
Achieving sub-nanometre particle mapping with energy-filtered TEM
This paper describes, for the first time, the application of multivariate statistical analysis to EFTEM datasets. By combining a state-of-the-art electron microscope with post-acquisition data processing, a record spatial resolution was achieved (still the world-leading value). More than 10 follow-on papers have applied the technique to a variety of materials with UK and international collaborators. These results were part of the case for support for the £6m EPSRC fusion/fission grant awarded to Oxford (EP/I003274/1) and the technique forms a major theme in the nuclear projects in the successful South of England Analytical TEM application in 2013 (EP/K040375/1).