Output details

Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison

This paper provides the first inter-comparison of a variety of molecular concentration mapping techniques that can be applied to the analysis of latent fingerprints. The work is a collaboration between Lincoln, Sheffield, East Anglia, Brunel, Imperial and the Home Office. MeV-SIMS demonstrated high potential for future forensics applications where ambient pressure analysis is important – this has generated much interest in the new technique and a number of new users to use the new instrument when complete. The inter-comparison has generated interest from the fingerprint community and led to an invited talk to the International Fingerprint Research Group in Sweden.