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Target identification enhancement using a combination of linear sampling method and adjoint sensitivity analysis

<01>In this paper a technique is shown for the first time that enables complete identification of a scattering object (e.g. aircraft, malignant tumours) using microwaves. The technique assumes no prior knowledge of the scatter’s material properties like electric permittivity and conductivity, and the far-field pattern is used as the only primary information in identification. The hybrid approach proposed consists of initially retrieving the shape and the position of the scattering object using a linear sampling method and then determining the electric permittivity and conductivity of the scatterer. Compared to existing techniques the solution proposed here results in high computational speed, efficiency and stability.