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A novel technique combining high-resolution synchrotron x-ray microtomography and x-ray diffraction for characterization of micro particulates

The paper presents a novel X-ray technique for characterising powdered solids at the single particle level: micro-tomography for particle shape; micro-diffraction for particle phase and orientation. Used in synergy with molecular modelling and powder characterisation (iGC, DVS etc.), it provides an exact definition of the surface science of fine particles from their formation stage via crystallisation through subsequent unit processes into formulated products. The work has led to further funding on single particle characterisation from Pfizer (Ivan.Marziano@pfizer.com), METRC and Diamond Light Source (Gwyndaf.Evans@diamond.ac.uk) as well as forming a key component of a recently shortlisted ERC Advanced Grant invited resubmission