Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Surrey
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Article title
Determination of the Deposition Order of Overlapping Latent Fingerprints and Inks Using Secondary Ion Mass Spectrometry
Type
D - Journal article
Title of journal
Analytical Chemistry
Article number
-
Volume number
84
Issue number
9
First page of article
4083
ISSN of journal
1520-6882
Year of publication
2012
URL
-
Number of additional authors
-
Additional information
Demonstrates a protocol that can be used in forensic case work to demonstrate the time sequencing of the laying down of fingerprints and inks on paper. This has not been possible to achieve in the past. It will eventually improve fingerprinting. The Netherlands Forensics Institute, one of the world’s leading forensics labs, has taken a serious interest in the application of SIMS to help with fingerprint analysis and is collaborating with Surrey. Further investigation of the technique in its conventional form and in ambient pressure SIMS system are under development together with NIST (USA) and NPL.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
