Output details
13 - Electrical and Electronic Engineering, Metallurgy and Materials
University of Sheffield : A - Electronic and Electrical Engineering
Article title
An improved ptychographical phase retrieval algorithm for diffractive imaging
Type
D - Journal article
Title of journal
Ultramicroscopy
Article number
-
Volume number
109
Issue number
10
First page of article
1256
ISSN of journal
03043991
Year of publication
2009
Number of additional authors
1
Additional information
Presents a highly-efficient algorithm to solve for the illumination field at the same time as an object function upon which it is incident, facilitating very high resolution, high phase-sensitive lensless microscopy. It is now being used for high-resolution X-ray imaging at many national synchrotron facilities (France, Germany (DESY – contact Prof H Chapman), Japan, Switzerland, USA (Berkeley and Argonne), Italy), each beamline of value £5-10m. This patented method (No: EP20110185312) was sold to Phase Focus Ltd, which now uses it in all its products, including its contact lens profilometer used by all four of the world’s biggest contact lens manufacturers.
Interdisciplinary
-
Cross-referral requested
-
Research group
None
Proposed double-weighted
No
Double-weighted statement
-
Reserve for a double-weighted output
No
Non-English
No
English abstract
-
